TY  - BOOK
AU  - Bowen, David Keith
AU  - Tanner, Brian K.
PY  - 1998
DA  - 1998//
TI  - High resolution X-ray diffractometry and topography
PB  - Taylor & Francis
CY  - London [u.a.]
SN  - 0850667585
LA  - English
N1  - D. Keith Bowen and Brian K. Tanner
ID  - 237833824
ER  -