TY  - BOOK
AU  - Wang, Zhong Lin
PY  - 1996
DA  - 1996//
TI  - Reflection electron microscopy and spectroscopy for surface analysis
ET  - 1. publ.
PB  - Cambridge Univ. Press
CY  - Cambridge [u.a.]
KW  - Materials
KW  - Microscopy
KW  - Surfaces (Technology)
KW  - Analysis
KW  - Reflection electron microscopy
SN  - 0521482666
LA  - English
N1  - Zhong Lin Wang
ID  - 188441417
ER  -