TY  - BOOK
AU  - Leblebici, Yusuf
PY  - 1993
DA  - 1993//
TI  - Hot-carrier reliability of MOS VLSI circuits
T3  - Kluwer international series in engineering and computer science 227
PB  - Kluwer
CY  - Boston [u.a.]
KW  - Integrated circuits
KW  - Very large scale integration
KW  - Defects
KW  - Mathematical models
KW  - Metal oxide semiconductors
KW  - Reliability
KW  - Hot carriers
SN  - 079239352X
LA  - English
N1  - by Yusuf Leblebici; Sung-Mo (Steve) Kang
ID  - 1623157048
ER  -