%0 Book
%T High resolution X-ray diffractometry and topography
%A Bowen, David Keith
%A Tanner, Brian K.
%D 1998
%I Taylor & Francis
%C London [u.a.]
%@ 0850667585
%G English
%F 237833824
%O D. Keith Bowen and Brian K. Tanner
%O Literaturangaben
%L 548/.83
%9 Text