%0 Book
%T Hot-carrier reliability of MOS VLSI circuits
%A Leblebici, Yusuf
%S Kluwer international series in engineering and computer science 227
%D 1993
%I Kluwer
%C Boston [u.a.]
%@ 079239352X
%G English
%F 1623157048
%O by Yusuf Leblebici; Sung-Mo (Steve) Kang
%O Literaturangaben
%L 621.395
%K Integrated circuits
%K Very large scale integration
%K Defects
%K Mathematical models
%K Metal oxide semiconductors
%K Reliability
%K Hot carriers
%9 Text