Polymer nucleation and crystallization investigated by in situ combination of atomic force microscopy (AFM) and fast scanning calorimetry (FSC) Zhang, Rui , 1989- (VerfasserIn) Androsch, René (AkademischeR BetreuerIn) Schick, Christoph , 1953- (AkademischeR BetreuerIn) Universität Rostock (Grad-verleihende Institution) Universität Rostock Mathematisch-Naturwissenschaftliche Fakultät (Grad-verleihende Institution) Text theses Text Hochschulschrift 2020 2020 eng ger electronic resourceremoteComputermedienOnline-Ressource1 Online-Ressource A chip based fast scanning calorimeter (FSC) is used as a fast hot-stage in an atomic force microscope (AFM). This way, the morphology of materials with a resolution from micro to nano meters after fast thermal treatments becomes accessible. FSC provides crystallization/melting curves of the sample just imaged by AFM. A combined AFM-FSC device is described, where the AFM sample holder is replaced by the FSC chip-sensor. The sample can be repeatedly annealed at pre-defined temperatures and times and the AFM images can be taken from exactly the same spot of the sample.<eng> vorgelegt von Rui Zhang GutachterInnen: Rene Androsch (Martin Luther University Halle-Wittenberg, Interdisciplinary Center for Transfer-oriented Research in Natural Sciences) ; Christoph Schick (University of Rostock, Institution of Physics & Competence Centre CALOR) Dissertation Universität Rostock 2020 530 547.8 540 http://purl.uni-rostock.de/rosdok/id00002777 https://doi.org/10.18453/rosdok_id00002777 https://nbn-resolving.org/urn:nbn:de:gbv:28-rosdok_id00002777-9 https://d-nb.info/1293660973/34 Polymer nucleation and crystallization investigated by in situ combination of atomic force microscopy (AFM) and fast scanning calorimetry (FSC)--(DE-627)1735924504 urn:nbn:de:gbv:28-rosdok_id00002777-9 doi: 10.18453/rosdok_id00002777 oclc: 1225596449 ppn: (DE-627)1735636568