@Book{356125351,
author="Orloff, Jon
and Utlaut, Mark
and Swanson, Lynwood",
title="High resolution focused ion beams: FIB and its applications ; the physics of liquid metal ion sources and ion optics and their application to focused ion beam technology",
year="2003",
publisher="Kluwer Academic, Plenum Publ.",
address="New York, NY [u.a.]",
keywords="Focused ion beams; Industrial applications; Ion bombardment",
note="Jon Orloff; Mark Utlaut and Lynwood Swanson",
note="Exemplare erscheinen in unterschiedlichen Gr{\"o}{\ss}en (Formate)",
note="Includes bibliographical references and index",
isbn="030647350X",
language="English"
}