@Book{237833824,
author="Bowen, David Keith
and Tanner, Brian K.",
title="High resolution X-ray diffractometry and topography",
year="1998",
publisher="Taylor {\&} Francis",
address="London [u.a.]",
note="D. Keith Bowen and Brian K. Tanner",
note="Literaturangaben",
isbn="0850667585",
language="English"
}