@Book{1623157048,
author="Leblebici, Yusuf",
title="Hot-carrier reliability of MOS VLSI circuits",
series="Kluwer international series in engineering and computer science 227",
year="1993",
publisher="Kluwer",
address="Boston [u.a.]",
keywords="Integrated circuits; Very large scale integration; Defects; Mathematical models; Metal oxide semiconductors; Reliability; Hot carriers",
note="by Yusuf Leblebici; Sung-Mo (Steve) Kang",
note="Literaturangaben",
isbn="079239352X",
language="English"
}